OBSERVATION OF AN INDEX-OF-REFRACTION-INDUCED CHANGE IN THE DRUDE PARAMETERS OF AG FILMS

被引：42

作者：

GUGGER, H

JURICH, M

SWALEN, JD

SIEVERS, AJ

机构：

[1] IBM CORP,RES LAB,SAN JOSE,CA 95193

[2] CORNELL UNIV,ATOM & SOLID STATE PHYS LAB,ITHACA,NY 14853

[3] CORNELL UNIV,CTR MAT SCI,ITHACA,NY 14853

来源：

PHYSICAL REVIEW B | 1984年 / 30卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.30.4189

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：4189 / 4195

页数：7

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