GROWTH OF DEVICE-QUALITY GAN AT 550-DEGREES-C BY ATOMIC LAYER EPITAXY

被引:60
作者
KARAM, NH
PARODOS, T
COLTER, P
MCNULTY, D
ROWLAND, W
SCHETZINA, J
ELMASRY, N
BEDAIR, SM
机构
[1] N CAROLINA STATE UNIV, DEPT PHYS, RALEIGH, NC 27695 USA
[2] N CAROLINA STATE UNIV, DEPT MAT SCI & ENGN, RALEIGH, NC 27695 USA
[3] N CAROLINA STATE UNIV, DEPT ELECT & COMP ENGN, RALEIGH, NC 27695 USA
关键词
D O I
10.1063/1.115519
中图分类号
O59 [应用物理学];
学科分类号
摘要
GaN single crystal films were grown by atomic layer epitaxy at 550°C. The room temperature photoluminescence properties of these low-temperature-grown films are dominated by band edge emission with intensity comparable to those grown by metalorganic chemical vapor deposition at 1000°C. The as-grown films have background-carrier concentrations that can be controlled to levels in the 1016/cm-3 range. Atomic layer epitaxy is therefore a good approach to the low temperature growth of nitride compounds.© 1995 American Institute of Physics.
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页码:94 / 96
页数:3
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