ORIENTATION DEPENDENCE OF OVERLAYER ATTENUATION OF ELECTRONS FOR CYLINDRICAL MIRROR ANALYZER AND A RETARDING FIELD ANALYZER

被引：23

作者：

SHELTON, JC ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1974年 / 3卷 / 06期

关键词：

D O I：

10.1016/0368-2048(74)80028-9

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：417 / 425

页数：9

共 16 条

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