FULL TEMPERATURE CALIBRATION FROM 4-K TO 300-K OF THE VOLTAGE RESPONSE OF PIEZOELECTRIC TUBE SCANNER PZT-5A FOR USE IN SCANNING TUNNELING MICROSCOPES

被引：42

作者：

VANDERVOORT, KG ^{[1
]}

ZASADZINSKI, RK ^{[1
]}

GALICIA, GG ^{[1
]}

CRABTREE, GW ^{[1
]}

机构：

[1] ARGONNE NATL LAB,DIV MAT SCI,ARGONNE,IL 60439

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 04期

关键词：

D O I：

10.1063/1.1144139

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have calibrated the displacement/voltage (angstrom/V) response of our piezoelectric scanning tube (PZT-5A) by imaging graphite at over 40 temperatures between 4 and 300 K. We have also calibrated the (angstrom/V) response as a function of voltage up to 220 V at room temperature, imaging a gold-plated diffraction grating. We find that the temperature dependence of the (angstrom/V) response is linear to within 10% and is reduced by a factor of 5.5 on decreasing temperature from 300 to 4.2 K. The near linearity with temperature of the (angstrom/V) response makes the PZT-5A lead zirconate titanate composition a convenient choice for low temperature scanning tunneling microscope piezo tube elements.

引用

页码：896 / 899

页数：4

共 21 条

[1] SCANNING TUNNELING MICROSCOPY OF THE ABRIKOSOV FLUX LATTICE WITH FERROMAGNETIC PROBES [J].