DEEP TRAPS IN GAAS REVEALED AT HIGH-RESOLUTION BY SIMPLE FAST PHOTOCAPACITANCE METHODS

被引:14
作者
WHITE, AM [1 ]
PORTEOUS, P [1 ]
DEAN, PJ [1 ]
机构
[1] ROY RADAR ESTAB,ST ANDREWS RD,GREAT MALVERN,WORCESTERSHIRE,ENGLAND
关键词
D O I
10.1007/BF02652888
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:91 / 107
页数:17
相关论文
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