MICROSTRUCTURE AND ELECTRONIC-PROPERTIES OF HYDROGENATED AMORPHOUS SILICON-CARBON ALLOYS

被引：6

作者：

YACOBI, BG ^{[1
]}

VONROEDERN, B ^{[1
]}

MAHAN, AH ^{[1
]}

JONES, KM ^{[1
]}

机构：

[1] SOLAR ENERGY RES INST,GOLDEN,CO 80401

来源：

PHYSICAL REVIEW B | 1985年 / 31卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.31.8257

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：8257 / 8258

页数：2

共 10 条

[1]

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[2] OPTICAL-PROPERTIES OF HYDROGENATED HARD CARBON THIN-FILMS [J].

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DISCHLER, B ;

NYAIESH, A .

THIN SOLID FILMS, 1982, 91 (01) :81-87

[3] HETEROGENEITIES AND SURFACE EFFECTS IN GLOW-DISCHARGE DEPOSITED HYDROGENATED AMORPHOUS-SILICON FILMS [J].

FRITZSCHE, H .

THIN SOLID FILMS, 1982, 90 (02) :119-129

[4] MICROSTRUCTURAL OBSERVATIONS OF SPUTTERED SILICON-TIN-HYDROGEN ALLOYS [J].

JONES, KM ;

WILLIAMSON, DL ;

YACOBI, BG .

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[5] MICROSTRUCTURE OF PLASMA-DEPOSITED A-SI-H FILMS [J].

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LUJAN, RA .

APPLIED PHYSICS LETTERS, 1979, 35 (03) :244-246

[6] EFFECTS OF INERT-GAS DILUTION OF SILANE ON PLASMA-DEPOSITED A-SI-H FILMS [J].

KNIGHTS, JC ;

LUJAN, RA ;

ROSENBLUM, MP ;

STREET, RA ;

BIEGLESEN, DK ;

REIMER, JA .

APPLIED PHYSICS LETTERS, 1981, 38 (05) :331-333

[7] STRUCTURAL, ELECTRICAL, AND OPTICAL-PROPERTIES OF A-SI1-XGEX-H AND AN INFERRED ELECTRONIC BAND-STRUCTURE [J].

MACKENZIE, KD ;

EGGERT, JR ;

LEOPOLD, DJ ;

LI, YM ;

LIN, S ;

PAUL, W .

PHYSICAL REVIEW B, 1985, 31 (04) :2198-2212

[8]

MAHAN AH, UNPUB J APPL PHYS

[9]

TAWADA Y, 1982, JPN J APPL PHYS S2, V21, P291

[10]

VONROEDERN B, 1984, UNPUB 5TH P S MAT NE

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