FINE-STRUCTURE NEAR THE C-K EDGE IN THE PHOTON W-VALUE OF METHANE

被引:11
作者
SAITO, N
SUZUKI, IH
机构
关键词
D O I
10.1016/0301-0104(86)85051-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:327 / 333
页数:7
相关论文
共 25 条
[1]   ELECTRON-ION COINCIDENCE MEASUREMENTS OF CH4 [J].
BACKX, C ;
VANDERWIEL, MJ .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1975, 8 (18) :3020-3033
[2]   PULSE-HEIGHT DISTRIBUTION IN LOW-ENERGY PROPORTIONAL COUNTER MEASUREMENTS [J].
BREYER, B .
NUCLEAR INSTRUMENTS & METHODS, 1973, 112 (1-2) :91-93
[3]   FINE-STRUCTURE ABOVE CARBON K-EDGE IN METHANE AND IN FLUOROMETHANES [J].
BROWN, FC ;
BACHRACH, RZ ;
BIANCONI, A .
CHEMICAL PHYSICS LETTERS, 1978, 54 (03) :425-429
[4]   DYNAMICS OF ADSORBATE CORE-HOLE DECAY [J].
CHEN, CT ;
DIDIO, RA ;
FORD, WK ;
PLUMMER, EW ;
EBERHARDT, W .
PHYSICAL REVIEW B, 1985, 32 (12) :8434-8437
[5]   MEASUREMENT OF W-VALUES OF LOW-ENERGY ELECTRONS IN SEVERAL GASES [J].
COMBECHER, D .
RADIATION RESEARCH, 1980, 84 (02) :189-218
[6]   SITE-SPECIFIC FRAGMENTATION OF SMALL MOLECULES FOLLOWING SOFT-X-RAY EXCITATION [J].
EBERHARDT, W ;
SHAM, TK ;
CARR, R ;
KRUMMACHER, S ;
STRONGIN, M ;
WENG, SL ;
WESNER, D .
PHYSICAL REVIEW LETTERS, 1983, 50 (14) :1038-1041
[7]   CORRELATION BETWEEN ELECTRON-EMISSION AND FRAGMENTATION INTO IONS FOLLOWING SOFT-X-RAY EXCITATION OF THE N2 MOLECULE [J].
EBERHARDT, W ;
STOHR, J ;
FELDHAUS, J ;
PLUMMER, EW ;
SETTE, F .
PHYSICAL REVIEW LETTERS, 1983, 51 (26) :2370-2373
[8]   CALCULATIONS OF THE AUGER TRANSITION RATES IN MOLECULES .1. EFFECT OF THE NON-SPHERICAL POTENTIAL - APPLICATION TO CH4 [J].
HIGASHI, M ;
HIROIKE, E ;
NAKAJIMA, T .
CHEMICAL PHYSICS, 1982, 68 (03) :377-382
[9]  
KEY RB, 1977, J PHYS B ATOM MOL PH, V10, P2521
[10]   INVESTIGATION OF STRUCTURE NEAR L2,3 EDGES OF ARGON, M4,5 EDGES OF KRYPTON AND N4,5 EDGES OF XENON, USING ELECTRON-IMPACT WITH HIGH-RESOLUTION [J].
KING, GC ;
TRONC, M ;
READ, FH ;
BRADFORD, RC .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1977, 10 (12) :2479-2495