MEASUREMENT OF ELECTRODYNAMIC PARAMETERS OF SUPERCONDUCTING FILMS IN FAR-INFRARED AND SUBMILLIMETER FREQUENCY RANGES

被引:2
作者
ANZIN, VB [1 ]
GORSHUNOV, BP [1 ]
KOZLOV, GV [1 ]
VOLKOV, AA [1 ]
LEBEDEV, SP [1 ]
FEDOROV, IV [1 ]
SCHUTZMANN, J [1 ]
RENK, KF [1 ]
机构
[1] UNIV REGENSBURG,INST ANGEW PHYS,W-8400 REGENSBURG,GERMANY
关键词
D O I
10.1016/0964-1807(93)90258-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The possibilities of measuring the complex conductivity of thin superconducting films by using the far-infrared and submillimeter reflectivity and transmissivity techniques are discussed. It is shown, that within the framework of standard approaches a satisfactory accuracy is available only for the imaginary part of the conductivity. The data on the electrodynamic properties of superconducting NbN films at frequencies 3-25 cm-1 are presented.
引用
收藏
页码:467 / 478
页数:12
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