PREPARATION AND CHARACTERIZATION OF MOCVD THIN-FILMS OF CADMIUM-SULFIDE

被引:21
作者
AJAYI, OB [1 ]
OSUNTOLA, OK [1 ]
OJO, IA [1 ]
JEYNES, C [1 ]
机构
[1] OBAFEMI AWOLOWO UNIV,DEPT CHEM,IFE,NIGERIA
关键词
D O I
10.1016/0040-6090(94)90211-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A film of stoichiometric cadmium sulphide on quartz substrate was deposited by Pyrolysis from bis-(morpholinodithioato-S,S') cadmium (C10H16N2O2S4Cd) (a single source precursor). The band gap of 2.4 eV was confirmed by optical absorption measurements. The stoichiometry and thickness were determined by Rutherford backscattering, and the absence of organic remnants in the film demonstrated by IR spectroscopy.
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页码:57 / 62
页数:6
相关论文
共 30 条
[1]   COMPOSITIONAL STUDIES OF VARIOUS METAL-OXIDE COATINGS ON GLASS [J].
AJAYI, OB ;
AKANNI, MS ;
LAMBI, JN ;
JEYNES, C ;
WATTS, JF .
THIN SOLID FILMS, 1990, 185 (01) :123-136
[2]   CHARACTERIZATION OF PYROLYTICALLY DEPOSITED V2O3 THIN-FILMS [J].
AJAYI, OB ;
ANANI, AA ;
OBABUEKI, AO .
THIN SOLID FILMS, 1981, 82 (02) :151-156
[3]   NUCLEATION AND GROWTH-CHARACTERISTICS OF SPRAY-PYROLYZED CDS THIN-FILMS [J].
ALBIN, DS ;
RISBUD, SH .
THIN SOLID FILMS, 1987, 147 (02) :203-212
[4]   MOCVD OF CDS ONTO (111)SILICON SUBSTRATES [J].
BOONE, JL ;
HOWARD, SA ;
MARTIN, DD ;
CANTWELL, G .
THIN SOLID FILMS, 1989, 176 (01) :143-150
[5]   TEMPERATURE DEPENDENCE OF THE WIDTH OF THE BAND GAP IN SEVERAL PHOTOCONDUCTORS [J].
BUBE, RH .
PHYSICAL REVIEW, 1955, 98 (02) :431-433
[6]  
BUBE RH, 1976, CRITICAL MATERIALS P, pCH16
[7]  
BUBE RH, 1974, ELECTRONIC PROPERTIE
[8]  
BUCHEL KH, 1977, CHEM PESTICIDES, P273
[9]   HIGH-EFFICIENCY SOLAR-CELLS WITH CDS WINDOW LAYERS [J].
COUTTS, TJ .
THIN SOLID FILMS, 1982, 90 (04) :451-460
[10]  
DORMAN SC, 1956, Patent No. 2766554