SURFACE AND INTERFACE SCATTERING OF CONDUCTION ELECTRONS IN AU/IN DOUBLE-LAYERS

被引：11

作者：

CHAUVINEAU, JP

MARLIERE, C

机构：

[1] CNRS, Inst d'Optique, Orsay, Fr, CNRS, Inst d'Optique, Orsay, Fr

来源：

THIN SOLID FILMS | 1985年 / 125卷 / 1-2期

关键词：

ELECTRIC CONDUCTIVITY - GOLD AND ALLOYS - Thin Films - INDIUM AND ALLOYS - Thin Films;

D O I：

10.1016/0040-6090(85)90390-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The purpose of this work is to provide some experimental information on the contribution of the interface scattering to the electrical resistance of Au/In double layers. With this aim authors deposited ultrathin indium overlayers onto recrystallized gold films, the free surface of which was nearly (111) oriented. They evaluated independently the amount of scattering by surface and bulk defects in the overlayer by analyzing the electrical resistance of single indium layers grown under similar conditions.

引用

页码：25 / 31

页数：7

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