USE OF ELECTRON PROBES IN STUDY OF RECOMBINATION RADIATION

被引：53

作者：

WITTRY, DB

KYSER, DF

机构：

来源：

关键词：

D O I：

10.1063/1.1702876

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2439 / &

共 12 条

[1] ABRAHAMS MS, 1960, PROPERTIES ELEMENTAL, P225
[2] BERNARD R, 1960, OPTIK, V13, P129
[3] GATOS HC, 1960, PROPERTIES ELEMENTAL, P225
[4] GLOCKER R, 1948, Z NATURFORSCH, VA 3, P147
[5] HEINRICH KFJ, 1963, ADV XRAY ANALYSIS, V6, P291
[6] MULLER WM, 1962, ADVANCES XRAY ANALYS, V5, P538
[7] MULLER WM, 1960, ADVANCES XRAY ANALYS, V3, P185
[8] MULLER WM, 1963, ADVANCES XRAY ANALYS, V6, P291
[9] NASLEDOV DN, 1962, SOV PHYS-SOLID STATE, V4, P2449
[10] THE SCANNING ELECTRON MICROSCOPE AND ITS FIELDS OF APPLICATION
SMITH, KCA
OATLEY, CW
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1955, 6 (11): : 391 - 399