ELECTRICAL AND OPTICAL EVIDENCE OF RESONANT TUNNELING OF HOLES IN AN N+N+ DOUBLE-BARRIER DIODE STRUCTURE UNDER ILLUMINATION

被引:29
作者
VODJDANI, N
COTE, D
THOMAS, D
SERMAGE, B
BOIS, P
COSTARD, E
NAGLE, J
机构
[1] Laboratoire Central de Recherches, Thomson-CSF, 91404, Orsay Cedex, Domaine de Corbeville
关键词
D O I
10.1063/1.102638
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using low-temperature photocurrent, steady-state and time-resolved photoluminescence, we have shown the importance of hole transport in the optical properties of n+in+ double-barrier diodes under operation. We have also seen evidence of resonant tunneling of minority holes in such an illuminated double-barrier diode.
引用
收藏
页码:33 / 35
页数:3
相关论文
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