X-RAY REFLECTIVITY STUDY OF THERMAL CAPILLARY WAVES ON LIQUID SURFACES

被引：158

作者：

OCKO, BM

WU, XZ

SIROTA, EB

SINHA, SK

DEUTSCH, M

机构：

[1] EXXON RES & ENGN CO,CORP RES LAB,ANNANDALE,NJ 08801

[2] BAR ILAN UNIV,DEPT PHYS,IL-52900 RAMAT GAN,ISRAEL

来源：

PHYSICAL REVIEW LETTERS | 1994年 / 72卷 / 02期

关键词：

D O I：

10.1103/PhysRevLett.72.242

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

X-ray reflectivity measurements have been carried out at the liquid/vapor interface of normal alkanes. The reflectivities over a large temperature range of different chain lengths (C20 and C36) provide a critical test of the various capillary wave models. Our data are most consistent with the hybrid model which allows for a molecular size dependent cutoff q(max) for the capillary waves and an intrinsic interface width sigma0.

引用

页码：242 / 245

页数：4

共 24 条

[1] SYNCHROTRON X-RAY STUDIES OF LIQUID-VAPOR INTERFACES [J].