SURFACE STUDIES ON URANIUM MONOCARBIDE USING XPS AND SIMS

被引：18

作者：

ASUVATHRAMAN, R ^{[1
]}

RAJAGOPALAN, S ^{[1
]}

ANANTHASIVAN, K ^{[1
]}

MATHEWS, CK ^{[1
]}

机构：

[1] INDIAN INST SCI,DEPT MET,BANGALORE 560012,KARNATAKA,INDIA

来源：

JOURNAL OF NUCLEAR MATERIALS | 1995年 / 224卷 / 01期

关键词：

D O I：

10.1016/0022-3115(95)00036-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The air-exposed surfaces of sintered and are-melted UC samples were examined by XPS and SIMS. XPS results indicate that the surface is covered with a very thin layer of UO2 mixed with free carbon, which would have formed along with the oxide during the reaction between UC and oxygen or moisture. From the SIMS depth profile of oxygen, the thickness of the oxide layer is found to be approximately 10 nm. The SIMS oxygen images of the surface as a function of etching time reveal that the surface of UC consists of a top layer of adsorbed moisture/oxygen; this contamination layer is followed by a layer containing uranium oxide, uranium hydroxide and free carbon and then grain boundary oxide and finally bulk UC. The behaviour of sintered and are-melted samples is similar.

引用

页码：25 / 30

页数：6

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