ENHANCEMENT OF SURFACE-ATOM INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA AT LOW X-RAY INCIDENCE ANGLES

被引：34

作者：

MEHTA, M ^{[1
]}

FADLEY, CS ^{[1
]}

机构：

[1] UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822

来源：

PHYSICS LETTERS A | 1975年 / 55卷 / 01期

关键词：

D O I：

10.1016/0375-9601(75)90394-1

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：59 / 61

页数：3

共 10 条

[1]

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[2]

BRUNNER J, 1975, J ELECTRON SPECTROSC, V5, P811

[3] SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

FADLEY, CS ;

BAIRD, RJ ;

SIEKHAUS, W ;

NOVAKOV, T ;

BERGSTROM, SA .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) :93-137

[4] INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS [J].

FADLEY, CS .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :725-754

[5]

FADLEY CS, TO BE PUBLISHED

[6] SURFACE SENSITIVITY AND ANGULAR DEPENDENCE OF X-RAY PHOTOELECTRON SPECTRA [J].

FRASER, WA ;

FLORIO, JV ;

DELGASS, WN ;

ROBERTSON, WD .

SURFACE SCIENCE, 1973, 36 (02) :661-674

[7]

Hedman J., 1972, PHYS SCRIPTA, V5, P93, DOI [10.1088/0031-8949/5/1-2/015, DOI 10.1088/0031-8949/5/1-2/015]

[8] ULTRASOFT-X-RAY REFLECTION, REFRACTION, AND PRODUCTION OF PHOTOELECTRONS (100-1000-EV REGION) [J].

HENKE, BL .

PHYSICAL REVIEW A, 1972, 6 (01) :94-&

[9] ATTENUATION LENGTHS OF LOW-ENERGY ELECTRONS IN SOLIDS [J].

POWELL, CJ .

SURFACE SCIENCE, 1974, 44 (01) :29-46

[10]

SCOFIELS JH, 1973, UCRL51326 REP

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