ERROR-CORRECTING CODES FOR SEMICONDUCTOR MEMORY APPLICATIONS - A STATE-OF-THE-ART REVIEW

被引：328

作者：

CHEN, CL

HSIAO, MY

机构：

来源：

关键词：

D O I：

10.1147/rd.282.0124

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：124 / 134

页数：11

共 41 条

[1]

Basham G. R., 1976, Computer Design, V15, p110, 112

[2]

BERLEKAMP ER, 1968, ALGEBRAIC CODING THE

[3]

Bose R. C., 1960, INFROM CONTROL, V3, P68, DOI DOI 10.1016/S0019-9958(60)90287-4

[4]

BOSSEN DC, 1978, IEEE T COMPUT, V27, P201, DOI 10.1109/TC.1978.1675072

[5] B-ADJACENT ERROR CORRECTION [J].

BOSSEN, DC .

[6] A SYSTEM SOLUTION TO THE MEMORY SOFT ERROR PROBLEM [J].

BOSSEN, DC ;

HSIAO, MY .

[7]

CARTER WC, 1976, IEEE T COMPUT, V25, P557, DOI 10.1109/TC.1976.1674655

[8] SHORTENED FINITE GEOMETRY CODES [J].

CHEN, CL .

INFORMATION AND CONTROL, 1972, 20 (03) :216-&

[9]

CHEN CL, 1983, IEEE T COMPUT, V32, P615, DOI 10.1109/TC.1983.1676293

[10] FAULT-TOLERANT MEMORY SIMULATOR [J].

CHEN, CL ;

RUTLEDGE, RA .