THE INTERPRETATION OF HREM IMAGES OF CRYSTALS

被引:14
作者
BURSILL, LA [1 ]
机构
[1] ARIZONA STATE UNIV,CTR SOLID STATE SCI,TEMPE,AZ 85287
关键词
CONVERGENT-BEAM ELECTRON DIFFRACTION - DEFECTS DETECTION - HIGH RESOLUTION ELECTRON MICROSCOPE - HREM IMAGES - SCHERZER CONDITIONS;
D O I
10.1016/0304-3991(85)90116-0
中图分类号
TH742 [显微镜];
学科分类号
摘要
(Edited Abstract)
引用
收藏
页码:1 / 9
页数:9
相关论文
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