VACUUM ULTRAVIOLET AND ULTRASOFT X-RAY DIODE DETECTORS FOR TOKAMAK PLASMAS

被引：12

作者：

LEE, P

GERNHARDT, J

ARMENTROUT, CJ

SNIDER, RT

机构：

[1] KMS FUS INC,ANN ARBOR,MI 48106

[2] EURATOM ASSOC,MAX PLANCK INST PLASMAPHYS,D-8046 GARCHING,FED REP GER

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 06期

关键词：

D O I：

10.1063/1.1139798

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：883 / 888

页数：6

共 21 条

[1] NBS DETECTOR STANDARDS FOR FAR ULTRAVIOLET [J].

CANFIELD, LR ;

JOHNSTON, RG ;

MADDEN, RP .

APPLIED OPTICS, 1973, 12 (07) :1611-1617

[2] PHOTOELECTRIC QUANTUM EFFICIENCIES AND FILTER WINDOW ABSORPTION-COEFFICIENTS FROM 20-EV TO 10-KEV [J].

DAY, RH ;

LEE, P ;

SALOMAN, EB ;

NAGEL, DJ .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (11) :6965-6973

[3]

DAY RH, 1981, LA7941MS LOS AL REP

[4]

DAY RH, 1981, AIP C P, V75, P44

[5]

GRANETZ RS, 1987, 14TH P EUR C CONTR F, P1256

[6]

Henke B. L., 1982, Atomic Data and Nuclear Data Tables, V27, P1, DOI 10.1016/0092-640X(82)90002-X

[7] 0.1-10-KEV X-RAY-INDUCED ELECTRON EMISSIONS FROM SOLIDS - MODELS AND SECONDARY-ELECTRON MEASUREMENTS [J].

HENKE, BL ;

SMITH, JA ;

ATTWOOD, DT .

JOURNAL OF APPLIED PHYSICS, 1977, 48 (05) :1852-1866

[8]

HOCKADAY R, COMMUNICATION

[9] DYNAMIC BEHAVIOR OF INTRINSIC IMPURITIES IN DOUBLET III DISCHARGES [J].

JAHNS, GL ;

EJIMA, S ;

GROEBNER, RJ ;

BROOKS, NH ;

FISHER, RK ;

HSIEH, CL ;

TAYLOR, TS ;

WESLEY, JC ;

FUJISAWA, N ;

SUGAWARA, T .

NUCLEAR FUSION, 1982, 22 (08) :1049-1059

[10]

KEILHACKER M, 1981, 8TH P INT C PLASM PH, V2

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