PRACTICAL POLYMER FILM CHARACTERIZATION USING HIGH-PERFORMANCE XPS METHODS

被引：5

作者：

DRUMMOND, IW

ROBINSON, KS

CARRICK, A

SCHMIEDEL, H

机构：

[1] SHIMADZU EUROPA GMBH,ALBERT HAHN STR 6-10,W-4100 DUISBURG 29,GERMANY

[2] KRATOS ANALYT LTD,MANCHESTER,ENGLAND

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1993年 / 346卷 / 1-3期

关键词：

D O I：

10.1007/BF00321413

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

New features of laboratory XPS instrument design have resulted in large increases in sensitivity for microprobe style analysis (''spatially keyed spectroscopy''). These capabilities give access to XPS valence band and other high resolution information for polymer analysis on a routine basis. Examples of the practical use of these techniques are presented.

引用

页码：200 / 204

页数：5

共 5 条

[1]

CHATIB M, 1991, PHYS REV, V44, P10

[2] METHODOLOGY, PERFORMANCE, AND APPLICATION OF AN IMAGING X-RAY PHOTOELECTRON SPECTROMETER [J].