RAMAN-SCATTERING IN LOW WAVENUMBER REGION AS A NEW PROBE TO STRUCTURAL-PROPERTIES OF MICROCRYSTALLINE SILICON

被引:28
作者
SHIMADA, T
KATAYAMA, Y
NAKAGAWA, K
MATSUBARA, H
MIGITAKA, M
MARUYAMA, E
机构
关键词
D O I
10.1016/0022-3093(83)90287-9
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:783 / 786
页数:4
相关论文
共 3 条
[1]  
IQBAL Z, 1982, J PHYS C SOLID STATE, V15, P337
[2]   STRUCTURAL ORDER AND OPTICAL-PROPERTIES OF TETRAHEDRAL AMORPHOUS SOLIDS [J].
MALEY, N ;
PILIONE, LJ ;
KSHIRSAGAR, ST ;
LANNIN, JS .
PHYSICA B & C, 1983, 117 (MAR) :880-882
[3]  
TEMPLE PA, 1973, PHYS REV B, V8, P685