INEXPENSIVE, QUANTITATIVE HYDROGEN DEPTH-PROFILING FOR SURFACE PROBES

被引：40

作者：

ROSS, GG

TERREAULT, B

GOBEIL, G

ABEL, G

BOUCHER, C

VEILLEUX, G

机构：

来源：

JOURNAL OF NUCLEAR MATERIALS | 1984年 / 128卷 / DEC期

关键词：

D O I：

10.1016/0022-3115(84)90446-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：730 / 733

页数：4

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