ULTRASHORT CARRIER LIFETIMES IN H+ BOMBARDED INP

被引：30

作者：

LAMPRECHT, KF

JUEN, S

PALMETSHOFER, L

HOPFEL, RA

机构：

[1] Institute of Experimental Physics, University of Innsbruck

来源：

APPLIED PHYSICS LETTERS | 1991年 / 59卷 / 08期

关键词：

D O I：

10.1063/1.106303

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We studied the lifetimes of photoexcited carriers in H+ bombarded InP for different damage doses by means of femtosecond luminescence spectroscopy. The lifetime decreases down to 95 fs for a dose of 1 X 10(16) cm-2. To our knowledge this is the shortest decay time for spontaneous light emission ever observed. The luminescence spectrum of the most damaged sample is inverted, indicating nonthermalized carrier distributions.

引用

页码：926 / 928

页数：3

共 11 条

[1]

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[2]

DOANY FE, 1990, SPRINGER SERIES ELEC, V24, P228

[3]

GUPTA S, 1990, SPRINGER SERIES CHEM, V53, P297

[4] NONTHERMALIZED ENERGY-DISTRIBUTIONS IN SYSTEMS WITH EXTREMELY SHORT CARRIER LIFETIMES [J].