COMPARISON OF METHODS FOR ANALYZING CENSORED LIFE DATA TO ESTIMATE RELATIONSHIPS BETWEEN STRESS AND PRODUCT LIFE

被引：18

作者：

HAHN, GJ ^{[1
]}

NELSON, W ^{[1
]}

机构：

[1] GE,CORP RES & DEV CTR,SCHENECTADY,NY 12345

来源：

关键词：

D O I：

10.1109/TR.1974.5215696

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：2 / 11

页数：10

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[3]

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[4]

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[5]

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GLASSER, M .

[7]

GLASSER M, 1967, BIOMETRICS, V21, P300

[8]

HAHN GJ, 1968, TIS68C366 GEN EL RES

[9]

HAHN GJ, 1971, INSULATION CIRCUITS, V17, P79

[10]

HAHN GJ, 1968, TIS68C277 GEN EL RES