CHIP SUBSTRATE RESISTANCE MODELING TECHNIQUE FOR INTEGRATED-CIRCUIT DESIGN

被引:50
作者
JOHNSON, TA [1 ]
KNEPPER, RW [1 ]
MARCELLO, V [1 ]
WANG, W [1 ]
机构
[1] IBM CORP,E FISHKILL FACIL,DIV GEN TECHNOL,HOPEWELL JUNCTION,NY 12533
关键词
D O I
10.1109/TCAD.1984.1270066
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:126 / 134
页数:9
相关论文
共 4 条
[1]  
Balbanian N., 1969, ELECTRICAL NETWORK T
[2]  
KNEPPER R, UNPUB
[3]   MEASUREMENT OF SHEET RESISTIVITIES WITH THE 4-POINT PROBE [J].
SMITS, FM .
BELL SYSTEM TECHNICAL JOURNAL, 1958, 37 (03) :711-718
[4]   ALGORITHMS FOR ASTAP - NETWORK ANALYSIS PROGRAM [J].
WEEKS, WT ;
JIMENEZ, AJ ;
MAHONEY, GW ;
MEHTA, D ;
QASSEMZADEH, H ;
SCOTT, TR .
IEEE TRANSACTIONS ON CIRCUIT THEORY, 1973, CT20 (06) :628-634