PROTON-INDUCED X-RAY-EMISSION OF SPHERICAL-PARTICLES - CORRECTIONS FOR X-RAY ATTENUATION

被引：16

作者：

JEX, DG ^{[1
]}

HILL, MW ^{[1
]}

MANGELSON, NF ^{[1
]}

机构：

[1] BRIGHAM YOUNG UNIV,DEPT PHYS,PROVO,UT 84602

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 49卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90231-I

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The intensity of X-rays from PIXE (particle induced X-ray emission) analysis of particulate matter may be reduced relative to that expected from thin samples because of two effects: reduced X-ray cross sections due to proton energy loss, and X-ray attenuation. An equation has been derived for the correction of reduced X-ray intensities emitted from spherical particles. An arbitrary but homogeneous particle composition is assumed. A single particle size or a particle size distribution may be selected. The angle of X-ray detection relative to the incident beam may also be selected. Calculations for X-ray emission lines from sodium to tin have been made for several particle compositions, several radius values and a particle size distribution. It was surprising to find that attenuation corrections were independent of detection angle for all emission lines and particle sizes studied. © 1990.

引用

页码：141 / 145

页数：5

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