STRUCTURE FACTOR DETERMINATION IN ALPHA-ZRO2 USING CRITICAL VOLTAGE EFFECT - COMMENT

被引:1
作者
David, M [1 ]
SERNEELS, R [1 ]
GEVERS, R [1 ]
机构
[1] RIJKS UNIV CTR ANTWERPEN, B-2020 Antwerp, BELGIUM
来源
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1976年 / 32卷 / NOV1期
关键词
D O I
10.1107/S0567739476002088
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:1010 / 1011
页数:2
相关论文
共 5 条
[1]   CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .4. INFLUENCE OF HIGH-ORDER SYSTEMATIC REFLECTIONS [J].
DAVID, M ;
GEVERS, R ;
SERNEELS, R .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1975, 70 (02) :577-590
[2]   CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .3. INFLUENCE OF WEAK BEAMS ON DEGENERACY [J].
GEVERS, R ;
DAVID, M ;
SERNEELS, R .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1975, 69 (02) :557-567
[3]   CONSEQUENCES OF BLOCHS THEOREM ON DYNAMICAL THEORY OF ELECTRON DIFFRACTION CONTRAST [J].
METHERELL, AJ ;
FISHER, RM .
PHYSICA STATUS SOLIDI, 1969, 32 (02) :551-+
[4]  
PLOC RA, 1974, 1974 P INT CRYST C M
[5]   ANALYTICAL REPRESENTATION OF ATOMIC SCATTERING AMPLITUDES FOR ELECTRONS [J].
SMITH, GH ;
BURGE, RE .
ACTA CRYSTALLOGRAPHICA, 1962, 15 (03) :182-&