CHARACTERIZATION OF HETEROEPITAXIAL CUIN3SE5 AND CUINSE2 LAYERS ON SI SUBSTRATES

被引:67
作者
TIWARI, AN
BLUNIER, S
FILZMOSER, M
ZOGG, H
SCHMID, D
SCHOCK, HW
机构
[1] ETH HONGGERBERG,FESTKORPERPHYS LAB,CH-8093 ZURICH,SWITZERLAND
[2] UNIV STUTTGART,INST PHYS ELEKTR,D-70569 STUTTGART,GERMANY
关键词
D O I
10.1063/1.112387
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial CuIn3Se5 layers were grown on CuInSe 2/Si(111) substrates by molecular beam epitaxy. Photoemission spectra of (112)-oriented CuIn3Se5 and CuInSe2 epitaxial layers were studied and the structures in the upper valence band are correlated with the Cu 3d and Se 4p density of states. The main valence band of CuInSe2 exhibits the three peak structure (consistent with theory) while a broadband with a shoulder is observed for the CuIn3Se 5 phase. Electron channeling and x-ray diffraction confirmed the epitaxial growth of (112)-oriented layer. Surface and bulk composition analyses, position of valence band maxima, and a Se related vibrational mode at 153 cm-1 in Raman scattering measurements established the growth of the CuIn3Se5 phase. © 1994 American Institute of Physics.
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收藏
页码:3347 / 3349
页数:3
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