FETAL ELECTROENCEPHALOGRAPHY - RELATIONSHIP TO NEONATAL AND ONE-YEAR DEVELOPMENTAL NEUROLOGICAL EXAMINATIONS IN HIGH-RISK INFANTS

被引：14

作者：

BORGSTEDT, AD

ROSEN, MG

CHIK, L

SOKOL, RJ

BACHELDER, L

LEO, P

机构：

[1] UNIV ROCHESTER,SCH MED & DENT,DEPT OBSTET & GYNECOL,ROCHESTER,NY

[2] UNIV ROCHESTER,SCH MED & DENT,DEPT PEDIAT,ROCHESTER,NY

[3] UNIV ROCHESTER,SCH MED & DENT,FETAL BRAIN RES LAB,ROCHESTER,NY

来源：

AMERICAN JOURNAL OF DISEASES OF CHILDREN | 1975年 / 129卷 / 01期

关键词：

D O I：

10.1001/archpedi.1975.02120380021006

中图分类号：

R72 [儿科学];

学科分类号：

100202 ;

摘要：

引用

页码：35 / 38

页数：4

共 28 条

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PAINE RS, 1966, NEUROLOGICAL EXAMINA

[10]

PARMELEE AH, 1970, BIOL NEONATE, V15, P65

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