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A HOLOGRAPHIC SPECKLE SHEARING TECHNIQUE FOR THE MEASUREMENT OF OUT-OF-PLANE DISPLACEMENT, SLOPE AND CURVATURE

被引：7
作者：
SHARMA, DK
MOHAN, NK
SIROHI, RS
机构：
[1] Indian Inst of Technology, Madras, India, Indian Inst of Technology, Madras, India
来源：
OPTICS COMMUNICATIONS | 1986年 / 57卷 / 04期
关键词：
Compendex;
D O I：
10.1016/0030-4018(86)90088-X
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
6
引用
收藏
页码：230 / 235
页数：6
相关论文
共 6 条
[1]   SANDWICH-DOUBLE EXPOSURE HOLOGRAMS FOR OPTICAL DIFFERENTIATION OF DISPLACEMENT PATTERNS [J].
PAOLETTI, D ;
DALTORIO, A .
OPTICS COMMUNICATIONS, 1984, 50 (06) :338-341
[2]   A REAL-TIME HOLOGRAPHIC MOIRE TECHNIQUE FOR THE MEASUREMENT OF SLOPE CHANGE [J].
RASTOGI, PK .
OPTICA ACTA, 1984, 31 (02) :159-167
[3]   SIMULTANEOUS MEASUREMENT OF SLOPE AND CURVATURE WITH A 3-APERTURE SPECKLE SHEARING INTERFEROMETER [J].
SHARMA, DK ;
SIROHI, RS ;
KOTHIYAL, MP .
APPLIED OPTICS, 1984, 23 (10) :1542-1546
[4]   MULTIAPERTURE SPECKLE SHEARING ARRANGEMENTS FOR STRESS-ANALYSIS [J].
SHARMA, DK ;
SIROHI, RS ;
KOTHIYAL, MP .
OPTICS COMMUNICATIONS, 1984, 49 (05) :313-317
[5]  
SHARMA DK, 1984, 12TH P S OPT OPT BAN, P133
[6]  
SHARMA DK, 1985, THESIS IIT MADRAS
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