MICROWAVE IMAGING - COMPLEX PERMITTIVITY RECONSTRUCTION BY SIMULATED ANNEALING

被引：84

作者：

GARNERO, L ^{[1
]}

FRANCHOIS, A ^{[1
]}

HUGONIN, JP ^{[1
]}

PICHOT, C ^{[1
]}

JOACHIMOWICZ, N ^{[1
]}

机构：

[1] LAB SIGNAUX & SYST,EQUIPE ELECTROMAGNET,F-91192 GIF SUR YVETTE,FRANCE

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1991年 / 39卷 / 11期

关键词：

D O I：

10.1109/22.97480

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper refers to quantitative reconstruction of the dielectric properties of a strongly inhomogeneous object by means of active microwave imaging. An iterative reconstruction algorithm based on simulated annealing is presented. In some cases, this method seems to be more efficient than iterative deterministic methods and we show that it can converge to an accurate solution when other methods diverge.

引用

页码：1801 / 1807

页数：7

共 16 条

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