X-RAY SUPERMIRRORS FOR BESSY-II

被引：19

作者：

ERKO, A

SCHAFERS, F

VIDAL, B

YAKSHIN, A

PIETSCH, U

MAHLER, W

机构：

[1] UNIV AIX MARSEILLE 3,FAC SCI ST JEROME,LOE,F-13397 MARSEILLE 20,FRANCE

[2] UNIV POTSDAM,DEPT PHYS,D-14469 POTSDAM,GERMANY

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 10期

关键词：

D O I：

10.1063/1.1146162

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

X-ray multilayer supermirrors for the energy range up to 20 keV have been theoretically studied and experimentally measured with synchrotron radiation. A multilayer mirror with 50 W/Si bilayers with different thicknesses on the Si substrate has a smooth reflectivity of up to 32% in the whole energy range from 5 to 22 keV at a grazing incidence angle of 0.32 degrees which is considerably larger than using total external reflection. (C) 1995 American Institute of Physics.

引用

页码：4845 / 4846

页数：2

共 5 条

[1] HOGHOJ P, 1994, 1994 TECHNICAL DIGES, V6, P142
[2] NOVEL VERSATILE X-RAY REFLECTOMETER FOR ANGLE AND ENERGY-DISPERSIVE CHARACTERIZATION OF LIQUID AND SOLID-SURFACES AND INTERFACES
METZGER, TH
LUIDL, C
PIETSCH, U
VIERL, U
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 350 (1-2) : 398 - 405
[3] MEZEI OF, 1987, PHYSICS FABRICATION
[4] VIDAL B, 1988, P SOC PHOTO-OPT INS, V688, P110
[5] VIDAL B, 1992, P SOC PHOTO-OPT INS, V1738, P31

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