CHIRP-FREE TRANSMISSION OVER 82.5 KM OF SINGLE-MODE FIBERS AT 2 GBIT/S WITH INJECTION LOCKED DFB SEMICONDUCTOR-LASERS

被引:55
作者
OLSSON, NA [1 ]
TEMKIN, H [1 ]
LOGAN, RA [1 ]
JOHNSON, LF [1 ]
DOLAN, GJ [1 ]
VANDERZIEL, JP [1 ]
CAMPBELL, JC [1 ]
机构
[1] AT&T BELL LABS,CRAWFORD HILL LAB,HOLMDEL,NJ 07733
关键词
D O I
10.1109/JLT.1985.1074146
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:63 / 67
页数:5
相关论文
共 17 条
[1]   A STUDY OF LOCKING PHENOMENA IN OSCILLATORS [J].
ADLER, R .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1946, 34 (06) :351-357
[2]   102-KM OPTICAL FIBER TRANSMISSION EXPERIMENTS AT 1.52 MU-M USING AN EXTERNAL CAVITY CONTROLLED LASER TRANSMITTER MODULE [J].
CAMERON, KH ;
CHIDGEY, PJ ;
PRESTON, KR .
ELECTRONICS LETTERS, 1982, 18 (15) :650-651
[3]   HIGH-PERFORMANCE AVALANCHE PHOTO-DIODE WITH SEPARATE ABSORPTION GRADING AND MULTIPLICATION REGIONS [J].
CAMPBELL, JC ;
DENTAI, AG ;
HOLDEN, WS ;
KASPER, BL .
ELECTRONICS LETTERS, 1983, 19 (20) :818-820
[4]   FREQUENCY CHIRP UNDER CURRENT MODULATION IN INGAASP INJECTION-LASERS [J].
DUTTA, NK ;
OLSSON, NA ;
KOSZI, LA ;
BESOMI, P ;
WILSON, RB ;
NELSON, RJ .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (07) :2167-2169
[5]  
IWAHITA K, 1982, ELECTRON LETT, V18, P937
[6]   WAVELENGTH VARIATION OF 1.6 MU-M WAVELENGTH BURIED HETEROSTRUCTURE GAINASP INP LASERS DUE TO DIRECT MODULATION [J].
KISHINO, K ;
AOKI, S ;
SUEMATSU, Y .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (03) :343-351
[7]  
KOBAYASHI S, 1981, IEEE J QUANTUM ELECT, V17, P681, DOI 10.1109/JQE.1981.1071166
[8]   PICOSECOND FREQUENCY CHIRPING AND DYNAMIC LINE BROADENING IN INGAASP INJECTION-LASERS UNDER FAST EXCITATION [J].
LIN, C ;
LEE, TP ;
BURRUS, CA .
APPLIED PHYSICS LETTERS, 1983, 42 (02) :141-143
[9]   TRANSIENT CHIRPING IN SINGLE-FREQUENCY LASERS - LIGHTWAVE SYSTEMS CONSEQUENCES [J].
LINKE, RA .
ELECTRONICS LETTERS, 1984, 20 (11) :472-474
[10]   102 KM UNREPEATERED MONOMODE FIBER SYSTEM EXPERIMENT AT 140 MBIT S WITH AN INJECTION LOCKED 1.52MU-M LASER TRANSMITTER [J].
MALYON, DJ ;
MCDONNA, AP .
ELECTRONICS LETTERS, 1982, 18 (11) :445-447