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RELATIONSHIP BETWEEN CAPTURE COEFFICIENT AND CAPTURE CROSS-SECTION - AVERAGE VELOCITY OF A MAXWELLIAN DISTRIBUTION OF CARRIERS IN A MEDIUM WITH AN ANISOTROPIC EFFECTIVE MASS TENSOR
被引:5
作者
:
CROWELL, CR
论文数:
0
引用数:
0
h-index:
0
机构:
FRAUNHOFER GESELL,INST ANGEW FESTKORPERPHYS,D-7800 FREIBURG,FED REP GER
FRAUNHOFER GESELL,INST ANGEW FESTKORPERPHYS,D-7800 FREIBURG,FED REP GER
CROWELL, CR
[
1
]
机构
:
[1]
FRAUNHOFER GESELL,INST ANGEW FESTKORPERPHYS,D-7800 FREIBURG,FED REP GER
来源
:
APPLIED PHYSICS
|
1976年
/ 9卷
/ 01期
关键词
:
D O I
:
10.1007/BF00901913
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:79 / 81
页数:3
相关论文
共 6 条
[1]
CHARACTERIZATION OF MULTIPLE DEEP LEVEL SYSTEMS IN SEMICONDUCTOR JUNCTIONS BY ADMITTANCE MEASUREMENTS
BEGUWALA, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF, DEPT ELECTR ENGN, LOS ANGELES, CA 90007 USA
UNIV SO CALIF, DEPT ELECTR ENGN, LOS ANGELES, CA 90007 USA
BEGUWALA, M
CROWELL, CR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF, DEPT ELECTR ENGN, LOS ANGELES, CA 90007 USA
UNIV SO CALIF, DEPT ELECTR ENGN, LOS ANGELES, CA 90007 USA
CROWELL, CR
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(02)
: 203
-
214
[2]
BEGUWALA MM, 1974, THESIS U SO CALIFORN
[3]
BLAKEMORE JS, 1962, SEMICONDUCTOR STAT, P185
[4]
RICHARDSON CONSTANT FOR THERMIONIC EMISSION IN SCHOTTKY BARRIER DIODES
CROWELL, CR
论文数:
0
引用数:
0
h-index:
0
CROWELL, CR
[J].
SOLID-STATE ELECTRONICS,
1965,
8
(04)
: 395
-
&
[5]
CASCADE CAPTURE OF ELECTRONS IN SOLIDS
LAX, M
论文数:
0
引用数:
0
h-index:
0
LAX, M
[J].
PHYSICAL REVIEW,
1960,
119
(05):
: 1502
-
1523
[6]
Milnes A. G., 1973, DEEP IMPURITIES SEMI, P91
←
1
→
共 6 条
[1]
CHARACTERIZATION OF MULTIPLE DEEP LEVEL SYSTEMS IN SEMICONDUCTOR JUNCTIONS BY ADMITTANCE MEASUREMENTS
BEGUWALA, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF, DEPT ELECTR ENGN, LOS ANGELES, CA 90007 USA
UNIV SO CALIF, DEPT ELECTR ENGN, LOS ANGELES, CA 90007 USA
BEGUWALA, M
CROWELL, CR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF, DEPT ELECTR ENGN, LOS ANGELES, CA 90007 USA
UNIV SO CALIF, DEPT ELECTR ENGN, LOS ANGELES, CA 90007 USA
CROWELL, CR
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(02)
: 203
-
214
[2]
BEGUWALA MM, 1974, THESIS U SO CALIFORN
[3]
BLAKEMORE JS, 1962, SEMICONDUCTOR STAT, P185
[4]
RICHARDSON CONSTANT FOR THERMIONIC EMISSION IN SCHOTTKY BARRIER DIODES
CROWELL, CR
论文数:
0
引用数:
0
h-index:
0
CROWELL, CR
[J].
SOLID-STATE ELECTRONICS,
1965,
8
(04)
: 395
-
&
[5]
CASCADE CAPTURE OF ELECTRONS IN SOLIDS
LAX, M
论文数:
0
引用数:
0
h-index:
0
LAX, M
[J].
PHYSICAL REVIEW,
1960,
119
(05):
: 1502
-
1523
[6]
Milnes A. G., 1973, DEEP IMPURITIES SEMI, P91
←
1
→