STRUCTURE OF CU ON IR(111) - A CASE-STUDY IN PHOTOELECTRON HOLOGRAPHY AND QUANTITATIVE PHOTOELECTRON DIFFRACTION

被引：4

作者：

TONNER, BP ^{[1
]}

ZHANG, J ^{[1
]}

HAN, ZL ^{[1
]}

机构：

[1] UNIV WISCONSIN, DEPT PHYS, MILWAUKEE, WI 53211 USA

来源：

APPLIED SURFACE SCIENCE | 1993年 / 70-1卷 / 1 -4 pt A期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0169-4332(93)90461-J

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Angle-dependent X-ray photoelectron diffraction is used to determine the structure of epitaxial copper films on Ir(111), for coverages below six monolayers in thickness. Diffraction patterns are analyzed using the methods of photoelectron holography to provide a qualitative picture of the near-neighbor structure. Two theoretical models are used for quantitative analysis of interatomic bond-lengths. The complementarity of the two approaches is illustrated by this case study comparison of holography and quantitative photoelectron diffraction.

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收藏

页码：378 / 385

页数：8

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