USE OF A SEMICONDUCTOR DETECTOR IN ANOMALOUS (RESONANCE) X-RAY-SCATTERING MEASUREMENT OF LOCAL-STRUCTURE OF AN AMORPHOUS ALLOY

被引：7

作者：

AUR, S

KOFALT, D

WASEDA, Y

EGAMI, T

CHEN, HS

TEO, BK

WANG, R

机构：

[1] UNIV PENN, RES STRUCT MATTER LAB, PHILADELPHIA, PA 19104 USA

[2] BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA

[3] PACIFIC NW LABS, RICHLAND, WA 99352 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1984年 / 222卷 / 1-2期

关键词：

D O I：

10.1016/0167-5087(84)90540-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：259 / 261

页数：3

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AUR, S
KOFALT, D
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TEO, BK
[J]. SOLID STATE COMMUNICATIONS, 1983, 48 (02) : 111 - 115
[2] APPLICATION OF DIFFERENTIAL ANOMALOUS X-RAY-SCATTERING TO STRUCTURAL STUDIES OF AMORPHOUS MATERIALS
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[J]. PHYSICAL REVIEW LETTERS, 1981, 46 (23) : 1537 - 1540
[3] KLUG HP, 1974, XRAY DIFFRACTION PRO, P86
[4] PARTIAL STRUCTURE FACTORS IN A LIQUID OR AMORPHOUS BINARY SYSTEM USING ANOMALOUS SCATTERING
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