FORM AND STABILITY OF CURRENT-VOLTAGE CHARACTERISTICS FOR IDEAL THERMAL SWITCHING

被引：16

作者：

JACKSON, JL ^{[1
]}

SHAW, MP ^{[1
]}

机构：

[1] WAYNE STATE UNIV,COLL ENGN,DETROIT,MI 48202

来源：

APPLIED PHYSICS LETTERS | 1974年 / 25卷 / 11期

关键词：

D O I：

10.1063/1.1655353

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：666 / 668

页数：3

共 16 条

[1] SWITCHING PHENOMENA IN THIN-FILMS [J].

ADLER, D .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (05) :728-738

[2]

BERGLUND CN, 1969, IEEE T ELECTRON DEVI, VED16, P432

[3] FILAMENTARY CONDUCTION IN VO2 COPLANAR THIN-FILM DEVICES [J].

DUCHENE, J ;

TERRAILL.M ;

PAILLY, P ;

ADAM, G .

APPLIED PHYSICS LETTERS, 1971, 19 (04) :115-&

[4] MECHANISM OF NEGATIVE RESISTANCE AND FILAMENTARY CONDUCTION IN THERMAL SWITCHING DEVICES [J].

DUCHENE, J ;

ADAM, G ;

AUGIER, D .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 8 (02) :459-&

[5]

FRITZSCHE H, 1972, AMORPHOUS LIQUID SEM, pCH6

[6] THERMAL EFFECTS IN AMORPHOUS-SEMICONDUCTOR SWITCHING [J].

KAPLAN, T ;

ADLER, D .

APPLIED PHYSICS LETTERS, 1971, 19 (10) :418-&

[7]

KAPLAN TK, 1972, J NON CRYST SOLIDS, V8, P544

[8] NONLINEAR ANLAYSIS OF GUNN EFFECT [J].

KNIGHT, BW ;

PETERSON, GA .

PHYSICAL REVIEW, 1966, 147 (02) :617-&

[9] THEORY OF ELECTRICAL INSTABILITIES OF MIXED ELECTRONIC AND THERMAL ORIGIN [J].

KROLL, DM .

PHYSICAL REVIEW B, 1974, 9 (04) :1669-1706

[10]

ROCKSTAD HK, 1973, IEEE T ELEC DEV, VED20, P593

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