INELASTIC-SCATTERING RATE FOR ELECTRONS IN THIN ALUMINUM FILMS DETERMINED FROM THE MINIMUM FREQUENCY FOR MICROWAVE STIMULATION OF SUPERCONDUCTIVITY

被引：23

作者：

VANSON, PC ^{[1
]}

ROMIJN, J ^{[1
]}

KLAPWIJK, TM ^{[1
]}

MOOIJ, JE ^{[1
]}

机构：

[1] DELFT UNIV TECHNOL,DEPT APPL PHYS,DELFT,NETHERLANDS

来源：

PHYSICAL REVIEW B | 1984年 / 29卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.29.1503

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1503 / 1505

页数：3

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