CONVERGENT BEAM DIFFRACTION STUDIES OF INTERFACES, DEFECTS, AND MULTILAYERS

被引：88

作者：

CHERNS, D

PRESTON, AR

机构：

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1989年 / 13卷 / 02期

关键词：

D O I：

10.1002/jemt.1060130204

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：111 / 122

页数：12

共 24 条

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