THE USE OF AN ELECTRON-BEAM ION TRAP IN THE STUDY OF HIGHLY CHARGED IONS

被引：181

作者：

LEVINE, MA

MARRS, RE

BARDSLEY, JN

BEIERSDORFER, P

BENNETT, CL

CHEN, MH

COWAN, T

DIETRICH, D

HENDERSON, JR

KNAPP, DA

OSTERHELD, A

PENETRANTE, BM

SCHNEIDER, MB

SCOFIELD, JH

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 43卷 / 03期

关键词：

D O I：

10.1016/0168-583X(89)90386-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：431 / 440

页数：10

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