MECHANISMS OF COPPER CHEMICAL VAPOR-DEPOSITION

被引:133
作者
COHEN, SL
LIEHR, M
KASI, S
机构
[1] IBM T. J. Watson Research Center, Yorktown Heights, NY 10598
关键词
D O I
10.1063/1.107370
中图分类号
O59 [应用物理学];
学科分类号
摘要
The mechanism of copper chemical vapor deposition from Cu(II)bis-hexafluoroacetylacetonate [Cu(hfac)2] and 1,5-cyclooctadiene-Cu(I)-hexafluoroacetylacetonate (COD-Cu-hfac) has been determined. The results explain the different processing conditions required for deposition from the precursors. Both molecules react at room temperature on Ag to form a similar Cu(I)-hfac surface intermediate. Subsequent reaction of the COD-Cu-hfac fragment can lead to loss of the organic ligands leaving clean Cu. In contrast, for Cu(hfac)2, the presence of one extra surface hfac requires the addition of an external reductant to produce a ligand-free Cu film.
引用
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页码:50 / 52
页数:3
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