THE DETERMINATION OF THE ORIENTATION AND THICKNESS OF THIN FOILS FROM TRANSMISSION ELECTRON MICROGRAPHS

被引：13

作者：

CROCKER, AG

BEVIS, M

机构：

来源：

PHYSICA STATUS SOLIDI | 1964年 / 6卷 / 01期

关键词：

D O I：

10.1002/pssb.19640060113

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：151 / 162

页数：12

共 6 条

[1] BEVIS M, PHYS STAT SOL
[2] THE SYSTEMATIC DETERMINATION OF CRYSTALLOGRAPHIC ORIENTATIONS FROM 3 OCTAHEDRAL TRACES ON A PLANE SURFACE
DRAZIN, MP
OTTE, HM
[J]. PHYSICA STATUS SOLIDI, 1963, 3 (05): : 824 - 858
[3] DRAZIN MP, 1964, TABLES DETERMINING C
[4] HECKSCHER F, UNPUB
[5] ELECTRON MICROSCOPY AND DIFFRACTION OF THIN FILMS - INTERPRETATION AND CORRELATION OF IMAGES AND DIFFRACTION PATTERNS
OTTE, HM
DASH, J
SCHAAKE, HF
[J]. PHYSICA STATUS SOLIDI, 1964, 5 (03): : 527 - 549
[6] THOMAS G, 1962, TRANSMISSION ELECTRO