USE OF REFLECTION HOLOGRAMS IN HOLOGRAPHIC INTERFEROMETRY AND SPECKLE CORRELATION FOR MEASUREMENT OF SURFACE-DISPLACEMENT

被引:24
作者
BOONE, PM [1 ]
机构
[1] UNIV GHENT,ST PIETERSNIEUW STR 41,B-9000 GHENT,BELGIUM
来源
OPTICA ACTA | 1975年 / 22卷 / 07期
关键词
D O I
10.1080/713819090
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:579 / 589
页数:11
相关论文
共 5 条
[1]   RECORDING OF IN-PLANE SURFACE DISPLACEMENT BY DOUBLE-EXPOSURE SPECKLE PHOTOGRAPHY [J].
ARCHBOLD, E ;
BURCH, JM ;
ENNOS, AE .
OPTICA ACTA, 1970, 17 (12) :883-&
[2]  
BOONE PM, TO BE PUBLISHED
[3]   MEASUREMENT OF IN-PLANE SURFACE STRAIN BY HOLOGRAM INTERFEROMETRY [J].
ENNOS, AE .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (07) :731-&
[4]  
GABOR D, 1968, P ROY SOC LOND A MAT, V304, P257
[5]  
GEVELS G, 1973, THESIS U BRUSSELS