LOW-TEMPERATURE MAGNETIC FORCE MICROSCOPE UTILIZING A PIEZORESISTIVE CANTILEVER

被引：73

作者：

YUAN, CW ^{[1
]}

BATALLA, E ^{[1
]}

ZACHER, M ^{[1
]}

DELOZANNE, AL ^{[1
]}

KIRK, MD ^{[1
]}

TORTONESE, M ^{[1
]}

机构：

[1] PARK SCI INSTRUMENTS,SUNNYVALE,CA 94089

来源：

APPLIED PHYSICS LETTERS | 1994年 / 65卷 / 10期

关键词：

D O I：

10.1063/1.112103

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have developed a low temperature magnetic force microscope capable of operation down to 6 K in vacuum by using piezoresistive cantilevers. We use the non-contact frequency modulation technique to detect the magnetic force gradient between an iron-coated tip and the sample. We demonstrate the operation of this new instrument by obtaining images of magnetic domains in VHS tape at room temperature, 77 and 6 K. This microscope is ideally suited for the characterization of thin films of high temperature superconductors.

引用

页码：1308 / 1310

页数：3

共 27 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].