CONSTRUCTION AND USES OF AN EFFICIENT BACKSCATTERED ELECTRON DETECTOR FOR SCANNING ELECTRON-MICROSCOPY

被引:38
作者
ROBINSON, VN [1 ]
机构
[1] UNIV NEW S WALES,SCH TEXT TECHNOL,POB 1,KENSINGTON 2033,NEW S WALES,AUSTRALIA
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1974年 / 7卷 / 08期
关键词
D O I
10.1088/0022-3735/7/8/019
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:650 / 652
页数:3
相关论文
共 12 条
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  • [8] REAPPRAISAL OF COMPLETE ELECTRON-EMISSION SPECTRUM IN SCANNING ELECTRON-MICROSCOPY
    ROBINSON, VN
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (12) : L105 - &
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