A METHOD FOR THE MEASUREMENT OF THERMAL-CONDUCTIVITY, THERMAL-DIFFUSIVITY, AND OTHER TRANSPORT-COEFFICIENTS OF THIN-FILMS

被引：36

作者：

VOLKLEIN, F

KESSLER, E

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1984年 / 81卷 / 02期

关键词：

D O I：

10.1002/pssa.2210810222

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：585 / 596

页数：12

共 8 条

[1] Abrosimov V. M., 1969, Fizika Tverdogo Tela, V11, P530
[2] Boiko B. T., 1973, Thin Solid Films, V17, P157, DOI 10.1016/0040-6090(73)90124-7
[3] BOIKOV YA, 1975, PRIB TEKH EKSPER, V2, P230
[4] PULSE METHOD FOR MEASUREMENT OF THERMAL-CONDUCTIVITY OF THIN-FILMS
KELEMEN, F
[J]. THIN SOLID FILMS, 1976, 36 (01) : 199 - 203
[5] EXPERIMENTAL DETERMINATION OF THERMAL-CONDUCTIVITY OF THIN-FILMS
NATH, P
CHOPRA, KL
[J]. THIN SOLID FILMS, 1973, 18 (01) : 29 - 37
[6] MEASUREMENT OF THERMAL-CONDUCTIVITY BY A PARALLEL FLOW SANDWICH TECHNIQUE USING PELTIER EFFECT
SAVVIDES, N
GOLDSMID, HJ
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (06): : 553 - &
[7] The optical constants of thinner metal layers in the infrared long wavelength
Woltersdorff, Wilhelm
[J]. ZEITSCHRIFT FUR PHYSIK, 1934, 91 (3-4): : 230 - 252
[8] [No title captured]