DOMAIN-WALL IMAGING BY MAGNETIC FORCE MICROSCOPY

被引：10

作者：

HARTMANN, U

GODDENHENRICH, T

LEMKE, H

HEIDEN, C

机构：

[1] Institute for Thin Film and Ion Technology, KFA-Julich, 0–5170, Jülich, Fed. Rep.

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1990年 / 26卷 / 05期

关键词：

D O I：

10.1109/20.104428

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The near-surface microfield emanating from 90° and 180°Bloch walls in highly perfect iron single crystals is imaged by magnetic force microscopy. Characteristic differences in field magnitude and symmetry are obtained for the two types of walls. Along subdivided 180°walls, the polarization reversal, associated with the presence of a Bloch line, is clearly detected. Small variations of the microfield along individual walls are attributed to near-surface crystalline defects of the samples. © 1990 IEEE

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页码：1512 / 1514

页数：3

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