FORBIDDEN-REFLECTION LATTICE IMAGING FOR THE DETERMINATION OF KINK DENSITIES ON PARTIAL DISLOCATIONS

[1] Alexander H., 1984, Dislocations 1984, P283

[2] Alexander H., 1986, DISLOCATIONS SOLIDS

[3] BURSILL LA, 1984, PHILOS MAG A, V49, P365, DOI 10.1080/01418618408233280

[4] LINE DEFECTS IN SILICON - THE 90-PERCENT PARTIAL DISLOCATION [J]. PHYSICAL REVIEW B, 1984, 30 (02): : 694 - 701

[5] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (03): : 549 - 556

[6] COWLEY JM, 1984, DIFFRACTION PHYSICS, P147

[7] DISLOCATION BENDS IN HIGH STRESS DEFORMED SILICON-CRYSTALS [J]. JOURNAL DE PHYSIQUE, 1983, 44 (NC-4): : 69 - 74

[8] GOTTSCHALK H, 1982, 10TH P INT C EL MICR

[9] HIRSCH PB, 1979, J PHYS-PARIS, V40, P529

[10] Hirth J.P., 1982, Theory of Dislocations

[1] Alexander H., 1984, Dislocations 1984, P283

[2] Alexander H., 1986, DISLOCATIONS SOLIDS

[3] BURSILL LA, 1984, PHILOS MAG A, V49, P365, DOI 10.1080/01418618408233280

[4] LINE DEFECTS IN SILICON - THE 90-PERCENT PARTIAL DISLOCATION [J]. PHYSICAL REVIEW B, 1984, 30 (02): : 694 - 701

[5] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (03): : 549 - 556

[6] COWLEY JM, 1984, DIFFRACTION PHYSICS, P147

[7] DISLOCATION BENDS IN HIGH STRESS DEFORMED SILICON-CRYSTALS [J]. JOURNAL DE PHYSIQUE, 1983, 44 (NC-4): : 69 - 74

[8] GOTTSCHALK H, 1982, 10TH P INT C EL MICR

[9] HIRSCH PB, 1979, J PHYS-PARIS, V40, P529

[10] Hirth J.P., 1982, Theory of Dislocations