ELECTRONIC SURFACE AND BULK CONTRIBUTIONS TO CORE-LEVEL XPS, XAS AND BIS IN CEPD7 COMPOUNDS

被引:18
作者
IWAMOTO, Y
NAKAZAWA, M
KOTANI, A
PARLEBAS, JC
机构
[1] UNIV TOKYO,ISSP,MINATO KU,TOKYO 106,JAPAN
[2] GEMME,IPCMS,CNRS,UMR 46,F-67037 STRASBOURG,FRANCE
关键词
D O I
10.1088/0953-8984/7/6/016
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We present a new theoretical analysis of various spectroscopic data (3d XPS, 2p XAS and BIS) of CePd7 compounds within the impurity Anderson model by using a consistent set of parameters and by taking into account, when needed, both bulk and surface contributions. Actually in this paper we restrict the calculation of the surface contribution to the most surface sensitive technique, i.e, the 3d XPS spectrum. The parameter values for the bulk contribution are chosen so as to obtain the best fit to the 2p XAS spectrum, which is the less surface sensitive spectrum. The present analysis gives a general satisfying accord with the three kinds of experiment, provided that a surface contribution, from almost gamma-like Ce, up to 37.5%, is included in the 3d XPS spectrum of CePd7, whereas only a bulk contribution is assumed for 2p XAS and BIS.
引用
收藏
页码:1149 / 1157
页数:9
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