STOCHASTIC-BEHAVIOR OF A 2-UNIT REPAIRABLE SYSTEM SUBJECT TO INSPECTION

被引：13

作者：

GOPALAN, MN

NAIDU, RS

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1982年 / 22卷 / 04期

关键词：

D O I：

10.1016/S0026-2714(82)80188-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：717 / 722

页数：6

共 4 条

GOPALAN, MN ;

NAIDU, RS .

MICROELECTRONICS AND RELIABILITY, 1982, 22 (04) :699-705

[2]

KINGMAN JFC, 1972, REGENERATIVE PHENOME

[3] REGENERATIVE STOCHASTIC PROCESSES [J].

SMITH, WL .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1955, 232 (1188) :6-31

[4] REGENERATIVE STOCHASTIC PROCESSES - COMMENTS [J].

SMITH, WL .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1960, 256 (1287) :496-501