MEASUREMENT OF SHORT-TERM STABILITY OF QUARTZ CRYSTAL RESONATORS AND IMPLICATIONS FOR CRYSTAL OSCILLATOR DESIGN AND APPLICATIONS

被引：44

作者：

WALLS, FL ^{[1
]}

WAINWRIGHT, AE ^{[1
]}

机构：

[1] NBS,TIME & FREQUENCY DIV,BOULDER,CO 80302

来源：

关键词：

D O I：

10.1109/TIM.1975.4314362

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：15 / 20

页数：6

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[5]

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[6]

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[7] EFFECTS OF NOISE IN OSCILLATORS [J].

HAFNER, E .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02) :179-&

[8]

HALFORD D, 1968, 22 FREQ CONTR S ATL

[9]

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[10]

JARVIS S, 1966, P IEEE, V54, P221